Field Emission
Scanning Electron Microscopy(FE-SEM)
HITACHI S-4500


sem_1.jpg

Field Emission Scanning Electron Microscopy(FE-SEM)
HITACHI S-4500
M1-716

This microscopy shows the image of the bright point line on the monitor by finding intensity of the 2nd electron beam or reflection electron beam which are generated by irradiating fine electron beam to the object in a vacuum.



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