| Atomic Force Microscope(AFM) M1-716 This microscope scans the surface of objects by fine probe, and shows the configuration of it. Resolution is largely dependent on the curvature of the probe. Therefore, by attaching carbon nanotube on the edge of the probe, we can realize higher resolution. In addition, it is possible to manipulate single nano object on the flat substance by probe, we can conduct both observation and manipulation of nano materials by one probe. |
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